Semiconductor Test Equipment Chemicals

 

Showing all 4 results

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    De-Ox™

    De-Ox is a de-oxidizer that will remove tin, lead oxides as well as other oxides from contact surfaces minimizing resistance levels and restoring semiconductor test sockets to optimal performance. De-Ox deoxidizes without “activating” the metal surface therefore subsequent re-growth of oxides is not altered. De-Ox removes only oxides, and will not attack most metals, except zinc and aluminum.

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    De-Ox™ II

    De-Ox II is a de-oxidizer that will remove tin, lead oxides as well as other oxides from contact surfaces minimizing resistance levels and restoring semiconductor test sockets to optimal performance. De-Ox II deoxidizes without “activating” the metal surface therefore subsequent re-growth of oxides is not altered. De-Ox II removes only oxides, and will not attack most metals, except zinc and aluminum. De-Ox II does not attack plastic surfaces in test sockets.

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    De-Ox™ Ultra

    De-Ox Ultra is a de-oxidizer that will remove tin, lead oxides as well as other oxides from contact surfaces minimizing resistance levels and restoring semiconductor test sockets to optimal performance. De-Ox Ultra deoxidizes without “activating” the metal surface therefore subsequent re-growth of oxides is not altered. De-Ox Ultra removes only oxides, and will not attack most metals, except zinc and aluminum. De-Ox Ultra does not attack plastic surfaces in test sockets.

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    ProbeWash™

    ProbeWash is a de-oxidizer that will remove aluminum contaminants and other oxides from contact surfaces. ProbeWash deoxidizes without “activating” the metal surface. As a result, probe resistance levels are returned to original levels. ProbeWash removes only oxides and will not attack most metals, except aluminum and zinc.